IEC 60749-12:2017
Current
Current
The latest, up-to-date edition.
Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency
Available format(s)
Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users
Language(s)
English - French
Published date
13-12-2017
Publisher
FOREWORD
1 Scope
2 Normative references
3 Terms and definitions
4 Test apparatus
5 Test method
6 Examination and test measurements
7 Failure criteria
8 Summary
Bibliography
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