IEC 60749-17:2003
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
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Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation
Hardcopy , PDF
English - French
20-02-2003
12-09-2022
FOREWORD
1 Scope and object
2 Test apparatus
3 Procedure
4 Summary
Used to determine the susceptibility of semiconductor devices to degradation in the neutron environment. Applicable to integrated circuits and discrete semiconductor devices.
| Committee |
TC 47
|
| DevelopmentNote |
Stability Date: 2020. (11/2017)
|
| DocumentType |
Standard
|
| Pages |
11
|
| PublisherName |
International Electrotechnical Committee
|
| Status |
Superseded
|
| SupersededBy |
| Standards | Relationship |
| NF EN 60749-17 : 2003 | Identical |
| NEN EN IEC 60749-17 : 2003 | Identical |
| I.S. EN 60749-17:2003 | Identical |
| PN EN 60749-17 : 2005 | Identical |
| BS EN 60749-17:2003 | Identical |
| CEI EN 60749-17 : 2004 | Identical |
| EN 60749-17:2003 | Identical |
| DIN EN 60749-17:2003-09 | Identical |
| UNE-EN 60749-17:2003 | Identical |
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