• IEC 60749-20:2020 RLV

    Current The latest, up-to-date edition.

    Semiconductor devices - Mechanical and climatic test methods - Part 20: Resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering heat

    Available format(s):  Hardcopy, PDF, PDF 3 Users, PDF 5 Users, PDF 9 Users

    Language(s):  English

    Published date:  31-08-2020

    Publisher:  International Electrotechnical Committee

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    Abstract - (Show below) - (Hide below)

    IEC 60749-20:2020 RLV contains both the official IEC International Standard and its Redline version. The Redline version is available in English only and provides you with a quick and easy way to compare all the changes between the official IEC Standard and its previous edition.

    IEC 60749-20:2020 provides a means of assessing the resistance to soldering heat of semiconductors packaged as plastic encapsulated surface mount devices (SMDs). This test is destructive. This edition includes the following significant technical changes with respect to the previous edition:
    - incorporation of a technical corrigendum to IEC 60749-20:2008 (second edition );
    - inclusion of new Clause 3;
    - inclusion of explanatory notes.

    General Product Information - (Show below) - (Hide below)

    Document Type Redline
    Publisher International Electrotechnical Committee
    Status Current
    Supersedes
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