IEC 60749-23:2004
Superseded
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
View Superseded by
Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life
Amended by
Available format(s)
Hardcopy , PDF
Published date
23-02-2004
Publisher
Superseded date
09-12-2025
Superseded by
€41.13
Excluding VAT
This test is used to determine the effects of bias conditions and temperature on solid state devices over time. It simulates the device operating condition in an accelerated way, and is primarily used for device qualification and reliability monitoring.
| Committee |
TC 47
|
| DocumentType |
Standard
|
| Pages |
32
|
| PublisherName |
International Electrotechnical Committee
|
| Status |
Superseded
|
| SupersededBy |
| Standards | Relationship |
| UNE-EN 60749-23:2005 | Identical |
Summarise
Important note : Users cannot be edited or removed once added to your Multi user PDF.