IEC 60749-27:2006
NA
Status of Standard is Unknown
Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)
Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users
18-07-2006
Important note : Users cannot be edited or removed once added to your Multi user PDF.Establishes a standard procedure for testing and classifying semiconductor devices according to their susceptibility to damage or degradation by exposure to a defined machine model (MM) electrostatic discharge (ESD). It may be used as an alternative test method to the human body model ESD test method. The objective is to provide reliable, repeatable ESD test results so that accurate classifications can be performed. This test method is applicable to all semiconductor devices and is classified as destructive
| DocumentType |
Standard
|
| Pages |
30
|
| PublisherName |
International Electrotechnical Committee
|
| Status |
NA
|
| Supersedes |
| Standards | Relationship |
| PNE-prEN 60749-27 | Identical |
| UNE-EN 60749-27:2006 | Identical |
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