IEC 60749-29:2003
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
View Superseded by
Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test
Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users
12-09-2022
English - French, Spanish, Castilian
04-11-2003
Important note : Users cannot be edited or removed once added to your Multi user PDF.Covers the I-test and the overvoltage latch-up testing of integrated circuits.The purpose of this test is to establish a method for determining integrated circuit latch-up characteristics and to define latch-up failure criteria. Latch-up characteristics are used in determining product reliability and minimizing "No Trouble Found" and "Electrical Overstress" failures due to latch-up.
| Committee |
TC 47
|
| DocumentType |
Standard
|
| Pages |
41
|
| PublisherName |
International Electrotechnical Committee
|
| Status |
Superseded
|
| SupersededBy |
| Standards | Relationship |
| UNE-EN 60749-29:2004 | Identical |
| BS EN 60749-29:2003 | Identical |
Access your standards online with a subscription
Features
-
Simple online access to standards, technical information and regulations.
-
Critical updates of standards and customisable alerts and notifications.
-
Multi-user online standards collection: secure, flexible and cost effective.