IEC 60749-41:2020
Current
Current
The latest, up-to-date edition.
Semiconductor devices - Mechanical and climatic test methods - Part 41: Standard reliability testing methods of non-volatile memory devices
Available format(s)
Hardcopy , PDF
Language(s)
English - French
Published date
22-07-2020
Publisher
€164.53
Excluding VAT
IEC 60749-41:2020 specifies the procedural requirements for performing valid endurance, retention and cross-temperature tests based on a qualification specification. Endurance and retention qualification specifications (for cycle counts, durations, temperatures, and sample sizes) are specified in JESD47 or are developed using knowledge-based methods such as in JESD94.
| Committee |
TC 47
|
| DocumentType |
Standard
|
| ISBN |
978-2-8322-8640-1
|
| Pages |
0
|
| ProductNote |
THIS STANDARD IS ALSO REFERES TO JEP122H, JESD47
|
| PublisherName |
International Electrotechnical Committee
|
| Status |
Current
|
| Standards | Relationship |
| I.S. EN IEC 60749-41:2020 | Identical |
| BS EN IEC 60749-41:2020 | Identical |
| EN IEC 60749-41:2020 | Identical |
| NEN-EN-IEC 60749-41:2020 | Identical |
| NF EN IEC 60749-41:2020 | Identical |
| PN-EN IEC 60749-41:2021-04 | Identical |
| CEI EN IEC 60749-41:2021 | Identical |
| UNE-EN IEC 60749-41:2020 | Identical |
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