IEC 60749-5:2003
Superseded
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
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Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test
Available format(s)
Hardcopy , PDF
Language(s)
English - French, Spanish, Castilian
Published date
17-01-2003
Publisher
Superseded date
12-09-2022
Superseded by
€20.57
Excluding VAT
Provides a steady-state temperature and humidity bias life test for the purpose of evaluating the reliability of non-hermetic packaged solid-state devices in humid environments.
| Committee |
TC 47
|
| DocumentType |
Standard
|
| Pages |
13
|
| PublisherName |
International Electrotechnical Committee
|
| Status |
Superseded
|
| SupersededBy |
| Standards | Relationship |
| BS EN 60749-5:2003 | Identical |
| UNE-EN 60749-5:2003 | Identical |
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