• There are no items in your cart

IEC 60749-5:2003

Superseded

Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

View Superseded by

Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test

Available format(s)

Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users

Superseded date

12-09-2022

Superseded by

IEC 60749-5:2017

Language(s)

English - French, Spanish, Castilian

Published date

17-01-2003

€20.79
Excluding VAT

Provides a steady-state temperature and humidity bias life test for the purpose of evaluating the reliability of non-hermetic packaged solid-state devices in humid environments.

Committee
TC 47
DocumentType
Standard
Pages
13
PublisherName
International Electrotechnical Committee
Status
Superseded
SupersededBy

Standards Relationship
BS EN 60749-5:2003 Identical
UNE-EN 60749-5:2003 Identical

Access your standards online with a subscription

Features

  • Simple online access to standards, technical information and regulations.

  • Critical updates of standards and customisable alerts and notifications.

  • Multi-user online standards collection: secure, flexible and cost effective.