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IEC 60749-9:2002

Superseded

Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

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Semiconductor devices - Mechanical and climatic test methods - Part 9: Permanence of marking

Available format(s)

Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users

Superseded date

12-09-2022

Published date

12-04-2002

Aims at testing and verifying that the markings on semiconductor devices will not become illegible when subject to solvents or cleaning solutions commonly used during the removal of solder flux residue from the printed circuit board assembly process.This test is applicable for all package types. The test should be considered non-destructive.The contents of the corrigendum of August 2003 have been included in this copy.

Committee
TC 47
DocumentType
Standard
Pages
9
PublisherName
International Electrotechnical Committee
Status
Superseded
SupersededBy

Standards Relationship
BS EN 60749-9:2002 Identical
UNE-EN 60749-9:2003 Identical

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