FOREWORD
1 General
1.1 Scope
1.2 Object
1.3 Normative references
2 Technical data
2.1 Units, symbols and terminology
2.2 Terms and definitions
2.3 Preferred values and characteristics
2.4 Marking
2.4.1 General
2.4.2 Coding
3 Quality assessment procedures
3.1 Qualification approval/quality assessment
systems
3.2 Primary stage of manufacture
3.3 Structurally similar components
3.4 Qualification approval procedures
3.5 Quality conformance inspection
3.5.1 Certified records of released lots
3.5.2 Delayed delivery
3.5.3 Release for delivery before the
completion of Group B tests
3.6 Alternative test methods
3.7 Unchecked parameters
4 Test and measurement procedures
4.1 General
4.2 Standard atmospheric conditions
4.2.1 Standard atmospheric conditions
for testing
4.2.2 Recovery conditions
4.2.3 Referee conditions
4.2.4 Reference conditions
4.3 Drying and recovery
4.4 Visual examination and check of dimensions
4.4.1 Visual examination
4.4.2 Marking
4.4.3 Dimensions (gauging)
4.4.4 Dimensions (detail)
4.5 Nominal varistor voltage or leakage current
(not applicable to pulse measurements)
4.5.1 Test procedure
4.5.2 Measurement and requirements
4.6 Pulse current
4.6.1 Standard pulse currents
4.6.2 Tolerances
4.6.3 Measurement of the pulse current
4.7 Voltage under pulse condition
4.8 Capacitance
4.9 Voltage proof (for insulated varistors only)
4.9.1 V-block method
4.9.2 Metal ball method
4.9.3 Foil method
4.10 Insulation resistance (for insulated varistors
only)
4.10.1 Test procedure
4.10.2 Measurement and requirements
4.11 Robustness of terminations
4.11.1 General
4.11.2 Test Ua[1] - Tensile
4.11.3 Test Ub - Bending (half of the number
of terminations)
4.11.4 Test Uc - Torsion (other half of the
number of terminations)
4.11.5 Test Ud - Torque (for terminations with
threaded studs or screws and for integral
mounting devices)
4.11.6 Visual examination
4.11.7 Final measurement
4.12 Resistance to soldering heat
4.12.1 Preconditioning
4.12.2 Test procedure
4.12.3 Recovery
4.12.4 Final inspection, measurement and
requirements
4.13 Solderability
4.13.1 Test procedure
4.13.2 Final inspection, measurements and
requirements
4.14 Rapid change of temperature
4.14.1 Initial measurement
4.14.2 Test procedure
4.14.3 Final inspection, measurement and
requirements
4.15 Bump
4.15.1 Initial measurement
4.15.2 Test procedure
4.15.3 Final inspection, measurement and
requirements
4.16 Shock
4.16.1 Initial measurement
4.16.2 Test procedure
4.16.3 Final inspection, measurement and
requirements
4.17 Vibration
4.17.1 Initial measurement
4.17.2 Test procedure
4.17.3 Final inspection, measurement
and requirements
4.18 Climatic sequence
4.18.1 Initial measurement
4.18.2 Dry heat
4.18.3 Damp heat, cyclic, Test Db, first cycle
4.18.4 Cold
4.18.5 Low air pressure
4.18.6 Damp heat, cyclic, Test Db, remaining
cycles
4.18.7 Final inspection, measurement and
requirements
4.19 Damp heat, steady state
4.19.1 Initial measurement
4.19.2 Test procedure
4.19.3 Final inspection, measurement and
requirements
4.20 Fire hazard
4.21 Endurance at upper category temperature
4.22 Solvent resistance of marking
4.22.1 Test procedure
4.22.2 Requirements
4.23 Component solvent resistance
4.23.1 Initial measurements
4.23.2 Test procedure
4.23.3 Measurement and requirements
4.24 Mounting (for surface mount varistors only)
Annex A (normative) Mounting for measurements of
varistors
Annex B (normative) Interpretation of sampling
plans and procedures as described in
IEC 60410 for use within the IEC quality
assessment system for electronic components
Annex C (normative) Rules for the preparation of
detail specifications for capacitors and
resistors for electronic equipment