FOREWORD
Clause
1 Scope and object
2 Normative references
3 Definitions and symbols
4 Characteristics of MCAs
5 Technical requirements
6 General
7 Test methods
7.1 Minimum and maximum measured signal pulse heights
7.1.1 Apparatus
7.1.2 Preparation for the test
7.1.3 Test procedure
7.1.4 Processing of measured data
7.1.5 Instability of the measured pulse height
7.1.6 Additional error of the measured pulse height
due to temperature changes
7.1.7 Additional error of the measured pulse height
due to supply voltage changes
7.2 Channel width
7.2.1 Apparatus
7.2.2 Preparation for the test
7.2.3 Test procedure
7.2.4 Processing of measured data
7.2.5 Main error of the channel width
7.2.6 Instability of the channel width
7.2.7 Additional error of the channel width due to
temperature changes
7.2.8 Additional error of the channel width due to
supply voltage changes
7.3 Zero point
7.3.1 Apparatus
7.3.2 Preparation for the test
7.3.3 Test procedure
7.3.4 Processing of measured data
7.3.5 Main error of the zero point
7.3.6 Instability of the zero point
7.3.7 Additional error of the zero point due to
temperature changes
7.3.8 Additional error of the zero point due to
supply voltage changes
7.4 Integral non-linearity
7.4.1 Apparatus
7.4.2 Preparation for the test
7.4.3 Test procedure
7.4.4 Processing of measured data
7.4.5 Variance of integral non-linearity due to
temperature changes
7.4.6 Variance of integral non-linearity due to
supply voltage changes
7.5 Differential non-linearity (DNL)
7.5.1 Methods for DNL measurements
7.5.2 A combined method for determining DNL, INL
and ADC noise
7.5.3 Scintillation counter method
7.6 Operating range
7.6.1 Apparatus
7.6.2 Preparation for the test
7.6.3 Test procedure
7.6.4 Processing of measured data
7.7 Dead time of the MCA
7.7.1 Apparatus
7.7.2 Preparation for the test
7.7.3 Test procedure
7.7.4 Processing of measured data
7.7.5 Subsidiary method
7.8 Maximum pulse frequency to be measured
7.8.1 Apparatus
7.8.2 Preparation for the test
7.8.3 Test procedure
7.8.4 Processing of measured data
7.9 Dead time correction error
7.9.1 Apparatus
7.9.2 Preparation for the test
7.9.3 Test procedure
7.9.4 Processing of measured data
7.10 Non-rectangular factor of channel profile
7.10.1 General method
7.10.2 Apparatus
7.10.3 Preparation for the test
7.10.4 Test procedure
7.10.5 Processing of measured data
7.11 System throughput
7.11.1 Apparatus
7.11.2 Preparation for the test
7.11.3 Test procedure
7.11.4 Processing of measured data
Figures
Annexes
A Technically based values of parameters of multi-channel
pulse height analyzers
B Calculation of the positions (modal channel) of
spectral lines
C Subsidiary method for local DNL measurements
D A quick DNL checking method
E Average dead time test method (auxiliary test)
F Bibliography