IEC 61435:2013
Current
The latest, up-to-date edition.
Nuclear instrumentation - High-purity germanium crystals for radiation detectors - Measurement methods of basic characteristics
Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users
English
12-08-2013
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FOREWORD
INTRODUCTION
1 Scope and object
2 Normative references
3 Terms, definitions, symbols and abbreviations
4 Measurement of net electrically-active impurity
concentrations
5 Deep level transient spectroscopy for the determination
of impurity-centre concentration
6 Crystallographic properties
Annex A (informative) - The Hall factor for n-type
and p-type HPGe
Annex B (informative) - Function f(R[AB,CD]/R[BC,DA)
versus R[AB,CD]/R[BC,DA]
Bibliography
IEC 61435:2013(E) is applicable to high-purity germanium crystals used for radiation detectors for gamma-rays and X-rays. Such germanium is monocrystalline and has a net concentration of fewer than 1011 electrically active impurity centers per cm3. This International Standard specifies terminology and test methods for measurements of basic characteristics of high-purity germanium crystals. Test methods for completed assembled germanium detectors are given in IEC 60973 and IEC 60759. The main technical changes with regard to the previous edition are as follows:
- review the existing requirements;
- update the terminology and definitions.
| Committee |
TC 45
|
| DevelopmentNote |
Stability date: 2020. (08/2013)
|
| DocumentType |
Standard
|
| Pages |
32
|
| PublisherName |
International Electrotechnical Committee
|
| Status |
Current
|
| Supersedes |
| Standards | Relationship |
| BS IEC 61435:2013 | Identical |
| NEN IEC 61435 : 2013 | Identical |
| IEC 60050-394:2007 | International Electrotechnical Vocabulary (IEV) - Part 394: Nuclear instrumentation - Instruments, systems, equipment and detectors |
| IEC 60973:1989 | Test procedures for germanium gamma-ray detectors |
| IEC 60050-121:1998 | International Electrotechnical Vocabulary (IEV) - Part 121: Electromagnetism |
| IEC 60050-521:2002 | International Electrotechnical Vocabulary (IEV) - Part 521: Semiconductor devices and integrated circuits |
| IEC 60050-393:2003 | International Electrotechnical Vocabulary (IEV) - Part 393: Nuclear instrumentation - Physical phenomena and basic concepts |
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