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IEC 61580-9:1996

Current

Current

The latest, up-to-date edition.

Methods of measurement for waveguides - Part 9: Reflection coefficient at rectangular waveguide interfaces

Available format(s)

Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users

Language(s)

English - French

Published date

03-07-1996

€20.79
Excluding VAT

FOREWORD
INTRODUCTION
1 Scope
2 Normative reference
3 List of symbols
4 Effect of dimensional changes and axial displacement
5 Angular misalignment between waveguide flanges
Figures

Gives the means for determining the reflection coefficient at the junction of two similar rectanglular waveguides due to: differences in the wavguide internal dimensions, lateral displacement between the waveguide axes in either the H or E plane and angular misalignment between the waveguide axes.

DevelopmentNote
Also numbered as BS EN 61580-9. (09/2005) Stability Date: 2017. (10/2012)
DocumentType
Standard
Pages
15
PublisherName
International Electrotechnical Committee
Status
Current

Standards Relationship
NEN 11580-9 : 1996 Identical
I.S. EN 61580-9:1999 Identical
PN EN 61580-9 : 2002 Identical
SN EN 61580-9 : 1996 Identical
CEI EN 61580-9 : 1997 Identical
EN 61580-9:1996 Identical
NF EN 61580-9 : 2002 Identical
DIN EN 61580-9:1997-05 Identical
UNE-EN 61580-9:1996 Identical

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