IEC 61671-4:2016
Current
The latest, up-to-date edition.
Standard for automatic test markup language (ATML) test configuration
Hardcopy , PDF
English
08-04-2016
1 Overview
2 Normative references
3 Definitions, acronyms, and abbreviations
4 TestConfiguration schema
5 TestConfiguration instance schema
6 ATML TestConfiguration XML schema names and
locations
7 ATML XML schema extensibility
8 Conformance
Annex A (informative) - IEEE download web-site
material associated with this document
Annex B (informative) - Test Configuration XML
element mappings to MTPSI card fields
Annex C (informative) - Examples
Annex D (informative) - Bibliography
Annex E (informative) - List of IEEE Participants
IEC 61671-4:2016(E) defines an exchange format, utilizing extensible markup language (XML), for identifying all of the hardware, software, and documentation that is needed to test and diagnose a unit under test (UUT) on an ATS.
| Committee |
TC 91
|
| DevelopmentNote |
Also numbered as IEEE 1671.4. Stability date: 2021. (04/2016)
|
| DocumentType |
Standard
|
| Pages |
45
|
| PublisherName |
International Electrotechnical Committee
|
| Status |
Current
|
| Standards | Relationship |
| NEN IEC 61671-4 : 2016 | Identical |
| BS IEC 61671-4:2016 | Identical |
| MIL-STD-780 Revision G:1992 | WORK UNIT CODES FOR AERONAUTICAL EQUIPMENT, UNIFORM NUMBERING SYSTEM |
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