IEC 61671-5:2016
Current
The latest, up-to-date edition.
Standard for automatic test markup language (ATML) test adapter description
Hardcopy , PDF
English
08-04-2016
1 Overview
2 Normative references
3 Definitions, acronyms, and abbreviations
4 TestAdapterDescription Schema
5 Schema - TestAdapterInstance.xsd
6 ATML TestAdapterDescription XML schema
names and locations
7 ATML XML schema extensibility
8 Conformance
Annex A (informative) - IEEE download website material
associated with this document
Annex B (informative) - Users information and examples
Annex C (informative) - Glossary
Annex D (informative) - Bibliography
Annex E (informative) - IEEE List of Participants
IEC 61672-5:2016(E) defines an exchange format, utilizing extensible markup language (XML), for both the static description of a test adapter by defining the interface between the unit under test (UUT) and the test station, and the specific description of test adapter instance information.
| Committee |
TC 91
|
| DevelopmentNote |
Also numbered as IEEE 61671-5. Stability date: 2021. (04/2016)
|
| DocumentType |
Standard
|
| Pages |
18
|
| PublisherName |
International Electrotechnical Committee
|
| Status |
Current
|
| Standards | Relationship |
| NEN IEC 61671-5 : 2016 | Identical |
| BS IEC 61671-5:2016 | Identical |
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