IEC 61788-24:2018
Current
The latest, up-to-date edition.
Superconductivity - Part 24: Critical current measurement - Retained critical current after double bending at room temperature of Ag-sheathed Bi-2223 superconducting wires
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English - French
18-06-2018
IEC 61788-24:2018 describes a test method for determining the retained critical current after double bending at room temperature of short and straight Ag- and/or Ag alloy-sheathed Bi-2223 superconducting wires that have the shape of a flat or square tape containing mono- or multicores of oxides. The wires can be laminated with copper alloy, stainless steel or Ni alloy tapes.
The test method is intended for use with superconductors that have a critical current less than 300 A and an n-value larger than 5.
Committee |
TC 90
|
DocumentType |
Standard
|
ISBN |
978-2-8322-5801-9
|
Pages |
58
|
PublisherName |
International Electrotechnical Committee
|
Status |
Current
|
This part of IEC 61788 describes a test method for determining the retained critical current after double bending at room temperature of short and straight Ag- and/or Ag alloy-sheathed Bi-2223 superconducting wires that have the shape of a flat or square tape containing monoor multicores of oxides.
Standards | Relationship |
NEN EN IEC 61788-24 : 2018en | Identical |
VDE 0390-24:2019-07 | Identical |
BS EN IEC 61788-24:2018 | Identical |
OVE EN IEC 61788-24: 2019 08 01 | Identical |
PN-EN IEC 61788-24:2019 | Identical |
EN IEC 61788-24:2018 | Identical |
SS-EN IEC 61788-24:2019 | Identical |
UNE-EN IEC 61788-24:2018 | Identical |
DIN EN IEC 61788-24:2019-07 | Identical |
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