IEC 62132-8:2012
Current
Current
The latest, up-to-date edition.
Integrated circuits - Measurement of electromagnetic immunity - Part 8: Measurement of radiated immunity - IC stripline method
Available format(s)
Hardcopy , PDF
Language(s)
English - French
Published date
06-07-2012
Publisher
€159.39
Excluding VAT
IEC 62132-8:2012 specifies a method for measuring the immunity of an integrated circuit (IC) to radio frequency (RF) radiated electromagnetic disturbances over the frequency range of 150 kHz to 3 GHz.
This publication is to be read in conjunction with IEC 62132-1:2006.
| Committee |
TC 47/SC 47A
|
| DevelopmentNote |
To be read in conjunction with IEC 62132-1. (07/2012) Stability Date: 2021. (11/2017)
|
| DocumentType |
Standard
|
| Pages |
46
|
| PublisherName |
International Electrotechnical Committee
|
| Status |
Current
|
| Standards | Relationship |
| NF EN 62132-8 : 2013 | Identical |
| NBN EN 62132-8 : 2012 | Identical |
| NEN EN IEC 62132-8 : 2012 | Identical |
| PN EN 62132-8 : 2013 | Identical |
| VDE 0847-22-8 : 2013 | Identical |
| DIN EN 62132-8 : 2013 | Identical |
| BS EN 62132-8:2012 | Identical |
| CEI EN 62132-8 : 2013 | Identical |
| EN 62132-8:2012 | Identical |
| UNE-EN 62132-8:2012 | Identical |
| BS EN 62132-1:2016 | Integrated circuits. Measurement of electromagnetic immunity General conditions and definitions |
| I.S. EN 62132-1:2016 | INTEGRATED CIRCUITS - MEASUREMENT OF ELECTROMAGNETIC IMMUNITY - PART 1: GENERAL CONDITIONS AND DEFINITIONS |
| 12/30268333 DC : 0 | BS EN 62132-1 - INTEGRATED CIRCUITS - MEASUREMENT OF ELECTROMAGNETIC IMMUNITY - PART 1: GENERAL CONDITIONS AND DEFINITIONS |
| IEC 62132-1:2015 | Integrated circuits - Measurement of electromagnetic immunity - Part 1: General conditions and definitions |
| EN 62132-1:2016 | Integrated circuits - Measurement of electromagnetic immunity - Part 1: General conditions and definitions |
| IEC 62132-1:2015 | Integrated circuits - Measurement of electromagnetic immunity - Part 1: General conditions and definitions |
| IEC 61000-4-20:2010 | Electromagnetic compatibility (EMC) - Part 4-20: Testing and measurement techniques - Emission and immunity testing in transverse electromagnetic (TEM) waveguides |
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