IEC 62431:2008

FOREWORD
1 Scope
2 Normative references
3 Terms, definitions and acronyms
   3.1 Terms and definitions
   3.2 Acronyms and symbols
4 Specimen
   4.1 Specimen specification
   4.2 Reference metal plate
        4.2.1 Material and thickness
        4.2.2 Surface roughness
        4.2.3 Flatness
        4.2.4 Size and shape
   4.3 Reference specimen for calibration
5 Specimen holder
6 Measurement equipment
   6.1 Type of network analyzer
   6.2 Antenna
        6.2.1 Horn antenna
        6.2.2 Lens antenna
   6.3 Amplifier
   6.4 Cable
7 Measurement condition
   7.1 Temperature and environment
   7.2 Warming up of measurement equipment
   7.3 Electromagnetic environment
8 Calibration of measurement system and measurement
   conditions
   8.1 Calibration of measurement system
   8.2 Measurement conditions
        8.2.1 Dynamic range
        8.2.2 Setting up of the network analyzer for keeping
               adequate dynamic range
9 Horn antenna method
   9.1 Measurement system
        9.1.1 Configuration of the measurement system
        9.1.2 Horn antenna
        9.1.3 Specimen holder
        9.1.4 Mounting of the specimen
        9.1.5 Antenna stand
   9.2 Measurement conditions
        9.2.1 Measurement environment
        9.2.2 Measuring distance
        9.2.3 Size of specimen
   9.3 Measurement procedures
10 Dielectric lens antenna method - focused beam method
   10.1 Outline
   10.2 Measurement system
        10.2.1 Transmitting and receiving antennas
        10.2.2 Focused beam horn antenna
        10.2.3 Specimen size
        10.2.4 Reference metal plate size
        10.2.5 Specimen holder
        10.2.6 Method of fixing the specimen and the reference
               metal plate
   10.3 Measurement procedures
11 Dielectric lens antenna method - parallel beam method
   11.1 Principle
        11.1.1 Outline
        11.1.2 Parallel EM wave beam formed using a EM wave
               lens
   11.2 Measurement system
        11.2.1 Composition of measurement system
        11.2.2 Dielectric lens antenna
   11.3 Specimen
        11.3.1 General
        11.3.2 Reference metal plate
        11.3.3 Size of specimen
   11.4 Measurement procedures
        11.4.1 Normal incidence
        11.4.2 Oblique Incidence
12 Test report
Annex A (informative) Reflection and scattering from metal
        plate - Horn antenna method
Annex B (informative) Reflectivity of reference specimens
        using horn antenna method
Annex C (informative) Specifications of commercially
        available antennas
Annex D (normative) Calibration using VNA
Annex E (informative) Dynamic range and measurement
        errors
Annex F (informative) Enlargement of dynamic range - Calibration
        by isolation
Annex G (informative) Relative permittivity of styrofoam and
        foamed polyethylene based on foam ratio
Annex H (informative) Calculation of Fraunhofer region - Horn
        antenna method

IEC 62431:2008 specifies the measurement methods for the reflectivity of electromagnetic wave absorbers (EMA) for the normal incident, oblique incident and each polarized wave in the millimetre-wave range. In addition, these methods are also equally effective for the reflectivity measurement of other materials:
- measurement frequency range: 30 GHz to 300 GHz;
- reflectivity: 0 dB to -50 dB;
- incident angle: 0° to 80°. It replaces and cancels IEC/PAS 62431. This bilingual version published in 2011-11, corresponds to the English version published in 2008-07.