IEC 62494-1:2008

FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 Terms and definitions
4 Requirements
  4.1 Creation of ORIGINAL DATA
  4.2 Determination of the RELEVANT IMAGE REGION and the
      VALUE OF INTEREST
  4.3 Requirements for the EXPOSURE INDEX
  4.4 Calibration of the EXPOSURE INDEX
  4.5 Determination of the CALIBRATION FUNCTION
  4.6 Determination of the INVERSE CALIBRATION FUNCTION
  4.7 Requirements for the DEVIATION INDEX
Annex A (informative) Details on the rationale, properties
                      and use of the EXPOSURE INDEX
Annex B (informative) Details on the rationale, properties
                       and use of the DEVIATION INDEX
Annex C (normative) Beam conditions to be used for calibration
Bibliography
Terminology - Index of defined terms

IEC 62494-1:2008 specifies definitions and requirements for the exposure index of images acquired with digital X-ray imaging systems. IEC 62494-1:2008 is applicable to digital X-ray imaging systems used in general radiography for producing projection X-ray images for general applications, such as, but not exclusively:
- computed radiography (CR) systems based on stimulable phosphors;
- flat-panel detector based systems;
- charge-coupled device (CCD) based systems.
Image intensifier based systems and systems for mammographic or dental application are not covered in this first edition. IEC 62494-1:2008 defines the exposure index only for images generated with a single irradiation event. Images generated from multiple irradiations (e.g., tomosynthetic or dual-energy images, multiple views on a single CR plate) are not covered.