IEC 62525:2007
Current
The latest, up-to-date edition.
Standard Test Interface Language (STIL) for Digital Test Vector Data
Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users
English
07-11-2007
Important note : Users cannot be edited or removed once added to your Multi user PDF.Defines a test description language that: Facilitates the transfer of large volumes of digital test vector data from CAE environments to automated test equipment ATE environments; Specifies pattern, format, and timing information sufficient to define the application of digital test vectors to a device under test (DUT); Supports the volume of test vector data generated from structured tests such as scan/automatic test pattern generation (ATPG), integral test techniques such as built-in self test (BIST), and functional test specifications for IC designs and their assemblies, in a format optimized for application in ATE environments.
| DevelopmentNote |
Also numbered as IEEE 1450. (11/2007) Stability Date: 2018. (12/2017)
|
| DocumentType |
Standard
|
| Pages |
143
|
| PublisherName |
International Electrotechnical Committee
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| Status |
Current
|
| Standards | Relationship |
| BS IEC 62525:2007 | Identical |
| NEN IEC 62525 : 2007 | Identical |
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