IEC 62526:2007
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The latest, up-to-date edition.
Standard for Extensions to Standard Test Interface Language (STIL) for Semiconductor Design Environments
Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users
English
07-11-2007
Provides an interface between digital test generation tools and test equipment. A test description language is defined that:(a) facilitates the transfer of digital test vector data from CAE to ATE environments;(b) specifies patten, format, and timing information sufficant to define the application of digital test vectors to a DUT;and (c) supports the volume of test vector data generated from structured tests.
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