• Shopping Cart
    There are no items in your cart

IEC 62527:2007

Current

Current

The latest, up-to-date edition.

Standard for Extensions to Standard Test Interface Language (STIL) for DC Level Specification

Available format(s)

Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users

Language(s)

English

Published date

07-11-2007

€244.32
Excluding VAT

STIL language constructs are defined to specify the DC conditions necessary to excute digital vectors on automated test equipment(ATE). STIL language extensions include structures for:(a) specifying the DC conditions for a device under test; specifying DC conditions either globally, by pattern burst, by pattern, or by vector;(c) specifying alternate DC levels;and (d) selecting DC levels and alternate levels within a period, much the same as timed format events.

DevelopmentNote
Also numbered as IEEE 1450.2. (11/2007) Stability Date: 2018. (09/2017)
DocumentType
Standard
ISBN
2-8318-9480-8
Pages
39
PublisherName
International Electrotechnical Committee
Status
Current

Standards Relationship
BS IEC 62527:2007 Identical
NEN IEC 62527 : 2007 Identical

IEEE 1450 : 2007 STANDARD TEST INTERFACE LANGUAGE (STIL) FOR DIGITAL TEST VECTOR DATA

Access your standards online with a subscription

Features

  • Simple online access to standards, technical information and regulations.

  • Critical updates of standards and customisable alerts and notifications.

  • Multi-user online standards collection: secure, flexible and cost effective.