IEC 62527:2007
Current
The latest, up-to-date edition.
Standard for Extensions to Standard Test Interface Language (STIL) for DC Level Specification
Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users
English
07-11-2007
Important note : Users cannot be edited or removed once added to your Multi user PDF.STIL language constructs are defined to specify the DC conditions necessary to excute digital vectors on automated test equipment(ATE). STIL language extensions include structures for:(a) specifying the DC conditions for a device under test; specifying DC conditions either globally, by pattern burst, by pattern, or by vector;(c) specifying alternate DC levels;and (d) selecting DC levels and alternate levels within a period, much the same as timed format events.
| DevelopmentNote |
Also numbered as IEEE 1450.2. (11/2007) Stability Date: 2018. (09/2017)
|
| DocumentType |
Standard
|
| ISBN |
2-8318-9480-8
|
| Pages |
39
|
| PublisherName |
International Electrotechnical Committee
|
| Status |
Current
|
| Standards | Relationship |
| BS IEC 62527:2007 | Identical |
| NEN IEC 62527 : 2007 | Identical |
| IEEE 1450 : 2007 | STANDARD TEST INTERFACE LANGUAGE (STIL) FOR DIGITAL TEST VECTOR DATA |
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