IEC 62527:2007
Current
Current
The latest, up-to-date edition.
Standard for Extensions to Standard Test Interface Language (STIL) for DC Level Specification
Available format(s)
Hardcopy , PDF
Language(s)
English
Published date
07-11-2007
Publisher
€267.36
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STIL language constructs are defined to specify the DC conditions necessary to excute digital vectors on automated test equipment(ATE). STIL language extensions include structures for:(a) specifying the DC conditions for a device under test; specifying DC conditions either globally, by pattern burst, by pattern, or by vector;(c) specifying alternate DC levels;and (d) selecting DC levels and alternate levels within a period, much the same as timed format events.
| DevelopmentNote |
Also numbered as IEEE 1450.2. (11/2007) Stability Date: 2018. (09/2017)
|
| DocumentType |
Standard
|
| ISBN |
2-8318-9480-8
|
| Pages |
39
|
| PublisherName |
International Electrotechnical Committee
|
| Status |
Current
|
| Standards | Relationship |
| BS IEC 62527:2007 | Identical |
| NEN IEC 62527 : 2007 | Identical |
| IEEE 1450 : 2007 | STANDARD TEST INTERFACE LANGUAGE (STIL) FOR DIGITAL TEST VECTOR DATA |
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