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IEC 62860-1:2013

Current

Current

The latest, up-to-date edition.

Test methods for the characterization of organic transistor-based ring oscillators

Available format(s)

Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users

Language(s)

English

Published date

05-08-2013

€119.56
Excluding VAT

1. Overview
2. Definitions, abbreviations and acronyms
3. Standard ring oscillator characterization
   procedures
Annex A (informative) - Bibliography
Annex B (informative) - IEEE List of Participants

IEC 62860-1:2013(E) covers recommended methods and standardized reporting practices for electrical characterization of printed and organic ring oscillators. Due to the nature of printed and organic circuits, significant measurement errors can be introduced if the electrical characterization design-of-experiment is not properly addressed. This standard describes the most common sources of measurement error, particularly for high-impedance electrical measurements commonly required for printed and organic ring oscillators. This standard also gives recommended practices in order to minimize and/or characterize the effect of measurement artifacts and other sources of error encountered while measuring printed and organic ring oscillators.Keywords: electrical characterization, high-impedance printing, organic transistor, printed electronics, ring oscillator

DevelopmentNote
Also numbered as IEEE 1620.1. (08/2013)
DocumentType
Standard
Pages
20
PublisherName
International Electrotechnical Committee
Status
Current

Standards Relationship
BS IEC 62860-1:2013 Identical
BS EN 62341-1-1:2009 Identical

IEEE 1139-2008 IEEE Standard Definitions of Physical Quantities for Fundamental Frequency and Time Metrology--Random Instabilities

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