IEC 62860:2013
Current
The latest, up-to-date edition.
Test methods for the characterization of organic transistors and materials
Hardcopy , PDF
English
05-08-2013
1. Overview
2. Definitions, acronyms, and abbreviations
3. Standard OFET characterization procedures
Annex A (informative) - Bibliography
Annex B (informative) - IEEE List of Participants
IEC 62860:2013(E) covers recommended methods and standardized reporting practices for electrical characterization of printed and organic transistors. Due to the nature of printed and organic electronics, significant measurement errors can be introduced if the electrical characterization design-of-experiment is not properly addressed. This standard describes the most common sources of measurement error, particularly for high-impedance electrical measurements commonly required for printed and organic transistors. This standard also gives recommended practices in order to minimize and/or characterize the effect of measurement artifacts and other sources of error encountered while measuring printed and organic transistors.Keywords: electrical characterization, FET, flexible electronics, high impedance, nanocomposite, nanotechnology, OFET, organic electronics, organic transistor, printed electronics, printing, transistor
| Committee |
TC 113
|
| DevelopmentNote |
Also numbered as IEEE 1620. (08/2013)
|
| DocumentType |
Standard
|
| ISBN |
978-2-8322-1014-7
|
| Pages |
23
|
| PublisherName |
International Electrotechnical Committee
|
| Status |
Current
|
| Standards | Relationship |
| NEN IEC 62860 : 2013 | Identical |
| BS IEC 62860:2013 | Identical |
| 17/30336222 DC : 0 | BS EN 62899-203 - PRINTED ELECTRONICS - PART 203 - MATERIALS - SEMICONDUCTOR INK |
| PD IEC/TS 62607-5-1:2014 | Nanomanufacturing. Key control characteristics Thin-film organic/nano electronic devices. Carrier transport measurements |
| IEC TS 62607-5-1:2014 | Nanomanufacturing - Key control characteristics - Part 5-1: Thin-film organic/nano electronic devices - Carrier transport measurements |
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