IEC 62951-1:2017
Current
The latest, up-to-date edition.
Semiconductor devices - Flexible and stretchable semiconductor devices - Part 1: Bending test method for conductive thin films on flexible substrates
Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users
English
10-04-2017
FOREWORD
1 Scope
2 Normative references
3 Terms, definitions and symbols
4 Test piece
5 Testing method and test apparatus
6 Test report
Annex A (informative) - X-Y-Theta bending test method
Annex B (informative) - Data analysis: Calculation
of bending radius and bending strain
Bibliography
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