IEC 62969-4:2018
Current
The latest, up-to-date edition.
Semiconductor devices - Semiconductor interface for automotive vehicles - Part 4: Evaluation method of data interface for automotive vehicle sensors
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English, English - French
18-06-2018
IEC 62969-4:2018 specifies a method of directly fault injection test for automotive semiconductor sensor interface that can be used to support the conformance assurance in the vehicle communications interface.
Committee |
TC 47
|
DocumentType |
Standard
|
ISBN |
9782832257913
|
Pages |
0
|
PublisherName |
International Electrotechnical Committee
|
Status |
Current
|
This part of IEC 62969 specifies a method of directly fault injection test for automotive semiconductor sensor interface that can be used to support the conformance assurance in the vehicle communications interface
Standards | Relationship |
VDE 0884-69-4:2019-03 | Identical |
DIN EN IEC 62969-4 : 2019-03 | Identical |
NEN-EN-IEC 62969-4:2018 | Identical |
PN-EN IEC 62969-4:2019 | Identical |
NF EN IEC 62969-4:2018 | Identical |
OVE EN IEC 62969-4: 2019 | Identical |
BS EN IEC 62969-4:2018 | Identical |
SS-EN IEC 62969-4:2018 | Identical |
EN IEC 62969-4:2018 | Identical |
SN EN IEC 62969-4:2018 | Identical |
UNE-EN IEC 62969-4:2018 | Identical |
BS EN 60893-3-7:2004+A1:2009 | Identical |
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