IEC 62979:2017
Current
The latest, up-to-date edition.
Photovoltaic modules - Bypass diode - Thermal runaway test
Hardcopy , PDF
English - French, English
10-08-2017
IEC 62979:2017 provides a method for evaluating whether a bypass diode as mounted in the module is susceptible to thermal runaway or if there is sufficient cooling for it to survive the transition from forward bias operation to reverse bias operation without overheating. This test methodology is particularly suited for testing of Schottky barrier diodes, which have the characteristic of increasing leakage current as a function of reverse bias voltage at high temperature, making them more susceptible to thermal runaway.
| Committee |
TC 82
|
| DocumentType |
Standard
|
| ISBN |
978-2-8322-7291-6
|
| Pages |
25
|
| PublisherName |
International Electrotechnical Committee
|
| Status |
Current
|
| Standards | Relationship |
| DIN EN 62979 : 2018-09 | Identical |
| EN 62979:2017 | Identical |
| UNE-EN 62979:2017 | Identical |
| BS EN 62979:2017 | Identical |
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