IEC PAS 60679-6:2008

INTRODUCTION
1 Scope
2 Normative references
3 Terms, definitions, glossary and general terms
4 Measurement method
  4.1 Frequency range and the measurement method
  4.2 Method of using the phase noise measurement value
  4.3 Measurement method for the use of the specially
      designed measurement equipment
  4.4 Block diagram of the measurement
  4.5 Input and output impedance of the measurement system
  4.6 Measurement equipment
  4.7 Test fixture
  4.8 Cable, tools and instruments, etc.
5 Measurement and the measurement environment
  5.1 Set-up before taking measurements
  5.2 Points to be considered and noted at the time of
      measurement
  5.3 Treatment after the measurement
6 Measurement
  6.1 Reference temperature
  6.2 Measurement of temperature characteristics
  6.3 Measurement under vibration
  6.4 Measurement at the time of impact
  6.5 Measurement in accelerated ageing
7 Other points to be noted
8 Miscellaneous
Annex A (normative) - Calculation method for the amount
        of phase jitter
  A.0 Introduction
  A.1 Explanation
  A.2 Relations between phase noise and phase jitter
  A.3 Commentary
      A.3.1 History of establishment and points to note
      A.3.2 Theoretical positioning of phase jitter
  A.4 Description
      A.4.1 RMS jitter
      A.4.2 Peak-to-peak jitter
      A.4.3 Random jitter
      A.4.4 Deterministic jitter
      A.4.5 Period (periodic) jitter
      A.4.6 Data-dependent jitter
      A.4.7 Total jitter
  A.5 Points to be considered for measurement
      A.5.1 Measurement equipment
      A.5.2 Factors of measurement errors
Bibliography

IEC/PAS 60679-6 applies to the phase jitter measurement of quartz crystal oscillators and SAW oscillators used for electronic devices and gives guidance for phase jitter that allows the accurate measurement of r.m.s. jitter.