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IEC PAS 62175:2000

Superseded

Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

View Superseded by

Marking permanency test method

Available format(s)

Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users

Superseded date

12-04-2002

Superseded by

IEC 60749-9:2017

Language(s)

English

Published date

24-08-2000

€20.79
Excluding VAT

Verifies that the markings on solid state semiconductor devices will not become illegible when subjected to solvents or cleaning solutions commonly used during the removal of solder flux residue from the printed circuit board assembly process.

DevelopmentNote
JOINT STANDARD DEVELOPED BY EIA/JEDEC - DOCUMENT IS ALSO AVAILABLE AS EIA/JESD 22-B107 (09/2000)
DocumentType
Miscellaneous Product
Pages
5
PublisherName
International Electrotechnical Committee
Status
Superseded
SupersededBy

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