IEC PAS 62180:2000
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
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Electrostatic discharge (ESD) sensitivity testing machine model (MM)
Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users
21-10-2003
English
22-08-2000
Important note : Users cannot be edited or removed once added to your Multi user PDF.
FOREWORD
1 Purpose
2 Apparatus
3 Qualification, calibration and waveform verification
4 Classification procedure
5 Failure criteria
6 Classification criteria
Establishes a standard procedure for testing and classifying microcircuits according to their susceptibility to damage or degradation by exposure to a defined machine Model (MM) electrostatic discharge (ESD). The objective is to provide reliable, repeatable MM ESD test results so that accurate classifications can be performed.
| DocumentType |
Miscellaneous Product
|
| Pages |
12
|
| PublisherName |
International Electrotechnical Committee
|
| Status |
Superseded
|
| SupersededBy |
| IEC 60747-8-4:2004 | Discrete semiconductor devices - Part 8-4: Metal-oxide-semiconductor field-effect transistors (MOSFETs) for power switching applications |
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