IEC TR 62433-2-1:2010
Current
The latest, up-to-date edition.
EMC IC modelling - Part 2-1: Theory of black box modelling for conducted emission
Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users
English, English - French
05-10-2010
Important note : Users cannot be edited or removed once added to your Multi user PDF.
FOREWORD
1 Scope
2 Integrated circuit and modelling board
3 Assumptions
4 Modelling
5 Parameter extractions
6 Implementation
Annex A (informative) - Nodal equation
Annex B (informative) - Example of black box modelling
Bibliography
IEC/TR 62433-2-1:2010 covers black box modelling which has the potential to make the modelling of conducted emission very simple, very fast, and can provide complete protection of proprietary information of IC vendors. This technical report is intended to provide the theoretical background on black box modelling for IC conducted emission.
| Committee |
TC 47/SC 47A
|
| DevelopmentNote |
Stability Date: 2013. (10/2012)
|
| DocumentType |
Technical Report
|
| Pages |
0
|
| PublisherName |
International Electrotechnical Committee
|
| Status |
Current
|
| Standards | Relationship |
| NEN NPR IEC/TR 62433-2-1 : 2010 | Identical |
| PD IEC/TR 62433-2-1:2010 | Identical |
| IEC 62014-1:2001 | Electronic design automation libraries - Part 1: Input/output buffer information specifications (IBIS version 3.2) |
| IEC TS 62404:2007 | Logic digital integrated circuits - Specification for I/O interface model for integrated circuit (IMIC version 1.3) |
| IEC TS 62433-1:2011 | EMC IC modelling - Part 1: General modelling framework |
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