Device embedded substrate - Part 2-2: Guidelines - Electrical testing

Available format(s)

Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users

Language(s)

English - French

Published date

04-12-2015

Publisher

International Electrotechnical Committee

FOREWORD
INTRODUCTION
1 Scope
2 Electrical tests
3 Electrical test procedure for
device embedded substrate
Bibliography

IEC TR 62878-2-2:2015 describes the necessary information on electrical testing for device embedded substrate. This includes the interconnection open- and short-circuit tests as well as the device functional test. It also provides guidelines by demonstrating the electrical test for device embedded substrate.

DevelopmentNote	Stability date: 2020. (12/2015)
DocumentType	Technical Report
Pages	29
PublisherName	International Electrotechnical Committee
Status	Current

Standards	Relationship
PD IEC/TR 62878-2-2:2015	Identical

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IEC TR 62878-2-2:2015

Device embedded substrate - Part 2-2: Guidelines - Electrical testing

Table of Contents

Abstract

General Product Information

International Equivalents

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