IEC TR 63571:2025
Current
The latest, up-to-date edition.
Semiconductor devices – Estimation method for lifetime conversion from “PART” to “SYSTEM”
Hardcopy , PDF
English
13-05-2025
IEC TR 63571:2025 describes a method to calculate “SYSTEM”-level lifetime from “PART”-level lifetime. It presents a general mathematical theory and simple calculation examples for educational purposes. Of the elements related to “SYSTEM”-level lifetime, software-related elements such as diagnostics are outside the scope of this document.
| Committee |
TC 47
|
| DocumentType |
Technical Report
|
| Pages |
24
|
| PublisherName |
International Electrotechnical Committee
|
| Status |
Current
|
| Supersedes |
|
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