Semiconductor devices – Estimation method for lifetime conversion from “PART” to “SYSTEM”

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Hardcopy , PDF

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English

Published date

13-05-2025

Publisher

International Electrotechnical Committee

€164.53

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IEC TR 63571:2025 describes a method to calculate “SYSTEM”-level lifetime from “PART”-level lifetime. It presents a general mathematical theory and simple calculation examples for educational purposes. Of the elements related to “SYSTEM”-level lifetime, software-related elements such as diagnostics are outside the scope of this document.

DocumentType	Technical Report
Pages	24
PublisherName	International Electrotechnical Committee
Status	Current
Supersedes	IEC GUIDE 113:2000 IEC GUIDE 122:2024 IEC 112:2017 IEC GUIDE 117:2010 IEC 60043:1931 IEC GUIDE 111:1998 IEC GUIDE 118:2017 IEC GUIDE 120:2018 IEC GUIDE 103:1980 IEC CA 01:2016 IEC GUIDE 121:2023 IEC 60041:1928 IEC 60035:1927 IEC GUIDE 115:2007 IEC GUIDE 123:2025 IEC GUIDE 110:1996 IEC 60029:1914 IEC GUIDE 108:1994 IEC 60037:1927 IEC GUIDE 112:1998 IEC GUIDE 119:2017 IEC 60042:1931 IEC GUIDE 114:2005 IEC 60038:1927 IEC 60044:1931 IEC GUIDE 116:2010

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IEC TR 63571:2025

Semiconductor devices – Estimation method for lifetime conversion from “PART” to “SYSTEM”

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