IEC TS 61994-4-4:2010
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
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Piezoelectric and dielectric devices for frequency control and selection - Glossary - Part 4-4: Materials - Materials for surface acoustic wave (SAW) devices
Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users
12-09-2022
English
24-06-2010
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FOREWORD
1 Scope
2 Normative references
3 Terms and definitions
Bibliography
IEC 61994-4-4:2010(E) specifies the terms and definitions for single crystal wafers applied for surface acoustic wave (SAW) devices representing the state of the art, which are intended for use in the standards and documents of IEC technical committee 49. This second edition cancels and replaces the first edition published in 2005. The main changes with respect to the previous edition are listed below:
- Terms and definitions are rearranged in accordance with the order of the alphabet.
- "reduced LN" is appended to terms and definitions.
- "reduced LT" is appended to terms and definitions.
- reduction process is appended to terms and definitions.
| Committee |
TC 49
|
| DevelopmentNote |
Stability Date: 2015. (10/2012)
|
| DocumentType |
Technical Specification
|
| Pages |
12
|
| PublisherName |
International Electrotechnical Committee
|
| Status |
Superseded
|
| SupersededBy | |
| Supersedes |
| Standards | Relationship |
| DD IEC/TS 61994-4-4:2010 | Identical |
| DIN IEC/TS 61994-4-4;DIN SPEC 41994-4-4:2011-11 | Identical |
| NEN NPR IEC/TS 61994-4-4 : 2010 | Identical |
| 07/30161553 DC : 0 | BS EN 60758 - SYNTHETIC QUARTZ CRYSTAL - SPECIFICATIONS AND GUIDE TO THE USE |
| ISO 4287:1997 | Geometrical Product Specifications (GPS) — Surface texture: Profile method — Terms, definitions and surface texture parameters |
| IEC TS 61994-4-1:2007 | Piezoelectric and dielectric devices for frequency control and selection - Glossary - Part 4-1: Piezoelectric materials - Synthetic quartz crystal |
| IEC 62276:2016 | Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods |
| IEC 60410:1973 | Sampling plans and procedures for inspection by attributes |
| IEC 60050-561:2014 | International Electrotechnical Vocabulary (IEV) - Part 561: Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection |
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