IEC TS 62492-1:2008
Current
The latest, up-to-date edition.
Industrial process control devices - Radiation thermometers - Part 1: Technical data for radiation thermometers
Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users
English - French
29-04-2008
IEC/TS 62492-1:2008 applies to radiation thermometry. It defines the technical data, i.e. metrological data to be given in data sheets and operating instructions for radiation thermometers with one wavelength range and one measurement field, to ensure that the data and terminology are used consistently. Its purpose is to facilitate comparability and testability. Therefore, unambiguous definitions are stipulated for stating technical data under standardised measuring conditions.
Committee |
TC 65/SC 65B
|
DevelopmentNote |
Stability Date: 2019. (09/2017)
|
DocumentType |
Technical Specification
|
Pages |
45
|
PublisherName |
International Electrotechnical Committee
|
Status |
Current
|
Standards | Relationship |
DD IEC TS 62492-1 : DRAFT 2008 | Identical |
NEN NPR IEC/TS 62492-1 : 2008 | Identical |
VDI 3786 Blatt 3:2012-10 | Environmental meteorology - Meteorologial measurements - Air temperature |
VDI/VDE 3511 Blatt 4.5:2015-06 | Temperature measurement in industry - Radiation thermometry - Practical application of radiation thermometers |
VDI 3786 Blatt 5:2015-10 | Environmental meteorology - Meteorological measurements - Radiation |
VDI/VDE 3511 Blatt 4.2:2014-02 | Temperature measurement in industry - Radiation thermometry - Maintenance and intended operation of radiation thermometers |
PD IEC/TS 62492-2:2013 | Industrial process control devices. Radiation thermometers Determination of the technical data for radiation thermometers |
API 551 : 2016 | PROCESS MEASUREMENT |
IEC TS 62492-2:2013 | Industrial process control devices - Radiation thermometers - Part 2: Determination of the technical data for radiation thermometers |
ISO/IEC Guide 98:1993 | Guide to the expression of uncertainty in measurement (GUM) |
ISO/IEC Guide 99:2007 | International vocabulary of metrology Basic and general concepts and associated terms (VIM) |
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