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IEEE 1450-1999

Superseded

Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

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IEEE Standard Test Interface Language (STIL) for Digital Test Vector Data

Available format(s)

PDF

Superseded date

24-04-2024

Language(s)

English

Published date

01-09-1999

Committee
Test Technology
DocumentType
Standard
Pages
140
PublisherName
Institute of Electrical & Electronics Engineers
Status
Superseded
SupersededBy

IEEE 1450.6-2005 IEEE Standard Test Interface Language (STIL) for Digital Test Vector Data-Core Test Language (CTL)
IEEE P1450.4 IEEE Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std 1450-1999) for Test Flow Specification
IEEE 1450.6.2-2014 IEEE Standard for Memory Modeling in Core Test Language
IEEE 1450.3-2007 IEEE Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std. 1450-1999) for Tester Target Specification
IEEE 1450.6.1-2009 IEEE Standard for Describing On-Chip Scan Compression

IEEE 260.1-1993 American National Standard Letter Symbols for Units of Measurement (SI Units, Customary Inch-Pound Units, and Certain Other Units)

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