IEEE 1450-1999
Superseded
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
View Superseded by
IEEE Standard Test Interface Language (STIL) for Digital Test Vector Data
Available format(s)
PDF
Superseded date
24-04-2024
Superseded by
Language(s)
English
Published date
01-09-1999
Important note : Users cannot be edited or removed once added to your Multi user PDF.| Committee |
Test Technology
|
| DocumentType |
Standard
|
| Pages |
140
|
| PublisherName |
Institute of Electrical & Electronics Engineers
|
| Status |
Superseded
|
| SupersededBy |
| IEEE 1450.6-2005 | IEEE Standard Test Interface Language (STIL) for Digital Test Vector Data-Core Test Language (CTL) |
| IEEE P1450.4 | IEEE Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std 1450-1999) for Test Flow Specification |
| IEEE 1450.6.2-2014 | IEEE Standard for Memory Modeling in Core Test Language |
| IEEE 1450.3-2007 | IEEE Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std. 1450-1999) for Tester Target Specification |
| IEEE 1450.6.1-2009 | IEEE Standard for Describing On-Chip Scan Compression |
| IEEE 260.1-1993 | American National Standard Letter Symbols for Units of Measurement (SI Units, Customary Inch-Pound Units, and Certain Other Units) |
Access your standards online with a subscription
Features
-
Simple online access to standards, technical information and regulations.
-
Critical updates of standards and customisable alerts and notifications.
-
Multi-user online standards collection: secure, flexible and cost effective.