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IEEE 1450-1999

Withdrawn

Withdrawn

A Withdrawn Standard is one, which is removed from sale, and its unique number can no longer be used. The Standard can be withdrawn and not replaced, or it can be withdrawn and replaced by a Standard with a different number.

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withdrawn

A Withdrawn Standard is one, which is removed from sale, and its unique number can no longer be used. The Standard can be withdrawn and not replaced, or it can be withdrawn and replaced by a Standard with a different number.

IEEE Standard Test Interface Language (STIL) for Digital Test Vector Data

Available format(s)

PDF

Withdrawn date

24-03-2022

Language(s)

English

Published date

01-09-1999

Committee
Test Technology
DocumentType
Standard
Pages
140
PublisherName
Institute of Electrical & Electronics Engineers
Status
Withdrawn
SupersededBy

IEEE 1450.6-2005 IEEE Standard Test Interface Language (STIL) for Digital Test Vector Data-Core Test Language (CTL)
IEEE P1450.4 IEEE Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std 1450-1999) for Test Flow Specification
IEEE 1450.6.2-2014 IEEE Standard for Memory Modeling in Core Test Language
IEEE 1450.3-2007 IEEE Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std. 1450-1999) for Tester Target Specification
IEEE 1450.6.1-2009 IEEE Standard for Describing On-Chip Scan Compression

IEEE 260.1-1993 American National Standard Letter Symbols for Units of Measurement (SI Units, Customary Inch-Pound Units, and Certain Other Units)

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€371.83
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