• There are no items in your cart

IEEE 300-1988

Withdrawn

Withdrawn

A Withdrawn Standard is one, which is removed from sale, and its unique number can no longer be used. The Standard can be withdrawn and not replaced, or it can be withdrawn and replaced by a Standard with a different number.

IEEE Standard Test Procedures for Semiconductor Charged-Particle Detectors

Available format(s)

PDF

Withdrawn date

07-11-2019

Language(s)

English

Published date

29-12-1988

Committee
Nuclear Instruments and Detectors
DocumentType
Standard
Pages
125
PublisherName
Institute of Electrical & Electronics Engineers
Status
Withdrawn

IEEE 759-1984 IEEE Standard Test Procedures for Semiconductor X-Ray Energy Spectrometers

IEEE 194-1977 IEEE Standard Pulse Terms and Definitions
IEEE 325-1986 IEEE Standard Test Procedures for Germanium Gamma-Ray Detectors

View more information
€189.44
Excluding VAT

Access your standards online with a subscription

Features

  • Simple online access to standards, technical information and regulations.

  • Critical updates of standards and customisable alerts and notifications.

  • Multi-user online standards collection: secure, flexible and cost effective.