IEEE C62.37 : 1996
Withdrawn
A Withdrawn Standard is one, which is removed from sale, and its unique number can no longer be used. The Standard can be withdrawn and not replaced, or it can be withdrawn and replaced by a Standard with a different number.
TEST SPECIFICATION FOR THYRISTOR DIODE SURGE PROTECTIVE DEVICES
17-10-2023
01-01-1996
1 Overview
1.1 Scope
1.2 Tests
1.3 Applicability and device function
2 Definitions of rated and other parameters
2.1 Rated parameter values
2.2 Definitions
2.3 Additional definitions
2.4 Temperature dependence of parameter
2.5 Gated thyristor surge protective device (SPD)
3 Service condition
3.1 Normal service conditions
3.2 Unusual service conditions
4 Standard design test procedure
4.1 Standard design test criteria
4.2 Statistical analysis
4.3 Thyristor surge protective devices (SPD)
test conditions
4.4 Rating test procedures
4.5 Characteristic test procedures
5 Failure modes
5.1 Degradation failure modes
5.2 Catastrophic failure mode
5.3 "Fail-safe" operation
Annex A (informative) - Thyristor terms
Annex B (informative) - Bibliography
Applies to two or three terminal, four or five layer, thyristor surge protection devices (SPDs) for application on systems with voltages equal to or less than 1000 V rms or 1200 V dc. These protective devices are designed to limit voltage surges on communication circuits and power circuits operating from a direct current (dc) to 420 Hz. Included in this standard are definitions, service conditions and a series of test criteria for the determining of characteristics of a thyristor SPD. If the characteristics differ with the direction of conduction then each polarity will be specified separately.
| Committee |
IEEE
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| DocumentType |
Standard
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| PublisherName |
Institute of Electrical & Electronics Engineers
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| Status |
Withdrawn
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| IEEE C62.50-2012 | IEEE Standard for Performance Criteria and Test Methods for Plug-in (Portable) Multiservice (Multiport) Surge-Protective Devices for Equipment Connected to a 120 V/240 V Single Phase Power Service and Metallic Conductive Communication Line(s) |
| IEEE C62.42.0-2016 | IEEE Guide for the Application of Surge-Protective Components in Surge-Protective Devices and Equipment Ports--Overview |
| IEEE C62.43.0-2017 | IEEE Guide for Surge Protectors and Protective Circuits Used in Information and Communications Technology Circuits, Including Smart Grid Data Networks--Overview |
| IEEE C62.37.1-2012 REDLINE | IEEE Guide for the Application of Thyristor Surge Protective Device Components |
| IEEE C62.33-1982 | IEEE Standard Test Specifications for Varistor Surge-Protective Devices |
| IEEE 4-2013 | IEEE Standard for High-Voltage Testing Techniques |
| IEEE C62.35-2010 | IEEE Standard Test Methods for Avalanche Junction Semiconductor Surge-Protective Device Components |
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