IEEE C62.59-2019
Current
Current
The latest, up-to-date edition.
IEEE Standard for Test Methods and Preferred Values for Silicon PN-Junction Clamping Diodes
Available format(s)
Hardcopy , PDF
Language(s)
English
Published date
31-10-2019
Important note : Users cannot be edited or removed once added to your Multi user PDF.This standard sets terms, test methods, test circuits, measurement procedures and preferred result values for diodes with one or more silicon PN-junctions used for surge voltage clamping in low-voltage systems.
| Committee |
Surge Protective Devices/Low Voltage
|
| DocumentType |
Test Method
|
| ISBN |
978-1-5044-6119-1
|
| Pages |
41
|
| PublisherName |
Institute of Electrical & Electronics Engineers
|
| Status |
Current
|
| IEEE C62.42.3-2017 | IEEE Guide for the Application of Surge Protective Components in Surge Protective Devices and Equipment Ports -- Part 3: Silicon PN-Junction |
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