IEEE DRAFT 1122 : AUG 96

1 Scope
2 References
3 General definitions
3.1 Digital recorder for measurements in high-voltage
         impulse tests (impulse digitizer)
3.2 Output of an impulse digitizer
3.3 Offset
3.4 Scale factor
3.5 Quantization characteristic
3.6 Static integral non-linearity (Is)
3.7 Rated resolution (r)
3.8 Full-scale value (Dfs)
3.9 Code k
3.10 Code bin width of code k (Wk)
3.11 Average code bin width (Wo)
3.12 Differential non-linearity (DNL)
3.13 Sampling Rate
3.14 Integral non-linearity of the time-base
3.15 Sampling interval variation
3.16 Record length
3.17 Quantization error
3.18 Warm-up time
3.19 Raw data
3.20 Least-processed data
3.21 Notation
3.22 Actual resolution (Ra)
3.23 Oversampling
3.24 Operating range:
4 Conditions of use
4.1 Range of operating conditions
4.2 Reference conditions
5 Analysis of the impulse waveform
5.1 General
5.2 Equivalent oscillogram method
5.3 Procedures for reading digital records
6 Accuracy requirements for impulse measurements
6.1 Limits on overall uncertainty
6.2 Limits on individual uncertainties
6.3 Input impedance
7 Acceptance tests
7.1 Differential non-linearity (impulse conditions)
7.2 Internal noise level
7.3 Rise time
7.4 Interference test
7.5 Ripple
7.6 Integral non-linearity
8 Performance tests
8.1 Pulse calibration
8.2 Alternative method
9 Performance checks
9.1 General
9.2 Pulse calibration
9.3 Alternative check
10 Record of performance
Annex A Bibliography

Applicable to digital recorders and digital oscilloscopes used for measurements during tests with high impulse voltages and high impulse currents. Covers the measuring characteristics and calibrations required to meet the measuring accuracy specified in IEEE 4 and IEEE C57.98.