IEEE DRAFT 1445 : JUL 98

1 OVERVIEW
1.1 SCOPE
1.2 PURPOSE
1.3 APPLICATION
2 REFERENCES
3 KEY TERMS AND ACRONYMS
3.1 KEY TERMS
3.2 ACRONYMS
4 DATA ORGANIZATION OVERVIEW OF THE DTIF STANDARD
         ENVIRONMENT
4.1 UUT MODEL GROUP
4.2 STIMULUS & RESPONSE GROUP
4.3 FAULT DICTIONARY GROUP
4.4 PROBE GROUP
5 FILE SPECIFICATIONS
5.1 HEADER File (1)
5.2 STIMULUS File (2)
5.3 PO_ RESPONSE FILE
5.4 PI_NAMES FILE
5.5 PO_NAMES FILE
5.6 MAIN_MODEL FILE
5.7 COMPONENT_TYPE FILE
5.8 USER_NODE FILE
5.9 INPUT_PIN_NAMES FILE
5.10 OUTPUT_PIN_NAMES FILE
5.11 NEAR_FROMS_POINTERS FILE
5.12 NEAR_FROMS FILE
5.13 EVENT FILE
5.14 SETTLED_STATE_ONLY FILE
5.15 SETTLED_STATE_ &_PULSES FILE
5.16 NODE_SOURCE FILE
5.17 STEPS FILE
5.18 F.D._POPATS FILE
5.19 F.D._FAULT_SIGNATURES File
5.20 F.D._PRINT_STRINGS File
5.21 TRISTATE_FROMS_POINTERS File
5.22 TRISTATE_FROMS File
5.23 PSEUDOPI_NAMES File
5.24 TIMING_SETS File
5.25 TIMING _PER_PATTERN File
5.26 PHASE _CONNECTIONS File
5.27 AUXILIARY_PIN_NAMES File
5.28 PI_FORMATS File
5.29 FORMAT_ATTRIBUTES File
5.30 F.D._CROSS_REFERENCE File
5.31 PROBETAG_ DEFINITIONS File
5.32 PROBETAG_ASSIGNMENTS File
5.33 BURSTS File
5.34 STIMULUS_TEXT File
5.35 NODE_NAMES File
5.36 EVENTS_INIT File
5.37 EQUIV_FAULTS File
5.38 PROBE_DETECTION File
5.39 F.D._EQUIV_SETS File
6 CONFORMANCE
6.1 END-TO-END TEST
6.2 DIAGNOSTIC TEST USING FAULT DICTIONARY
6.3 DIAGNOSTIC TEST USING PROBE
A. ANNEX A - IMPLEMENTATION OVERVIEW
A.1 APPLICATION DEVELOPMENT ENVIRONMENT
A.1.1 Digital fault simulator
A.1.2 DTIF formatter
A.1.3 ATE software interface
A.2 ATE ENVIRONMENT
A.2.1 Test executive
A.2.2 Digital test unit (DTU)
A.2.3 Interface device (ID)
A.2.4 Unit under test (UUT)
B. ANNEX B - DTIF DEPENDENCY DIAGRAMS
C. ANNEX C - EXAMPLE CIRCUIT
C.1 INPUT SOURCE FILES
C.1.1 Batch.com
C.1.2 Example.net
C.1.3 Faultpin.flt
C.1.4 Stim.pat
C.1.5 Timing.pat
C.2 RESULTANT DTIF COMPLIANT OUTPUT FILES
C.2.1 HEADER file
C.2.2 STIMULUS file
C.2.3 PO_RESPONSE file
C.2.4 PI_NAMES file
C.2.5 PO_NAMES file
C.2.6 MAIN_MODEL file
C.2.7 COMPONENT_TYPE file
C.2.8 USER_NODE file
C.2.9 INPUT_PIN_NAMES file
C.2.10 OUTPUT_PIN_NAMES files
C.2.11 NEAR_FROMS_POINTERS file
C.2.12 NEAR_FROMS file
C.2.13 EVENT file
C.2.14 SETTLED_STATE_ONLY file
C.2.15 SETTLED_STATE_&_PULSES file
C.2.16 NODE_SOURCE file
C.2.17 STEPS file
C.2.18 F.D._POPATS file
C.2.19 F.D._FAULTS SIGNATURES file
C.2.20 F.D._PRINT STRINGS file
C.2.21 TRISTATE_FROMS_POINTERS file
C.2.22 TRISTATE_FROMS file
C.2.23 PSEUDOPI_NAMES file
C.2.24 TIMING_SETS file
C.2.25 TIMING_PER_PATTERN file
C.2.26 PHASE_CONNECTIONS file
C.2.27 AUXILIARY_PIN_NAMES file
C.2.28 PI-FORMATS file
C.2.29 FORMAT_ATTRIBUTES file
C.2.30 F.D._CROSS_REFERENCE file
C.2.31 PROBETAG_DEFINITIONS file
C.2.32 PROBETAG_ASSIGNMENTS file
C.2.33 BURSTS file
C.2.34 STIMULUS_TEXT file
C.2.35 NODE_NAMES file
C.2.36 EVENTS_INIT file
C.2.37 EQUIV_FAULTS file
C.2.38 PROBE_DETECTION file
C.2.39 F.D._EQUIV_SETS file

Designed to provide a mechanism for data interchange dependent of specific test system and constrained to ensure implementation of automatic test equipment.