IEEE DRAFT 1450.2 : D16 2002
Withdrawn
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EXTENSIONS TO STANDARD TEST INTERFACE LANGUAGE (STIL) (IEEE STD. 1450-1999) FOR DC LEVEL SPECIFICATION
22-05-2024
01-01-2002
1 Overview
1.1 Scope
1.2 Purpose
2 References
3 Definitions, acronyms, and abbreviations
3.1 Definitions
3.2 Acronyms and abbreviations
4 Structure of this standard
5 Extensions to Clause 6 "STIL Syntax Description"
5.1 Additional reserved words
5.2 DC expressions and units (dc_expr)
5.3 Additions to STIL name spaces and name resolution
(IEEE Std. 1450-1999 Clause 6.16)
6 Statement structure and organization of STIL information
6.1 Top-level statements and required ordering
6.2 Optional top-level statements
7 Extensions to Clause 8 "STIL statement"
7.1 STIL syntax
7.2 STIL example
8 Extensions to Clause 19 "Spec and Selector blocks"
9 Extensions to Clause 16 "PatternExec block"
9.1 PatternExec block syntax
9.2 PatternExec block example
9.3 DCLevels and DCSets Usage in PatternExec and Pattern Blocks
10 DCLevels block
10.1 DCLevels block syntax
10.2 DCLevels block example
10.3 InheritDCLevels Processing
11 DCSets block
11.1 DCSets block syntax
11.2 DCSets statement example
12 DCSequence block
12.1 DCSequence block syntax
12.2 DCSequence example
13 Extensions to Clause 18 "WaveformTable block"
13.1 event definition in WaveformTable block
13.2 Mapping of event integers to DCLevels statements
13.3 DC Levels Switching Example
14 Extensions to Clause 22 "STIL Pattern statements"
14.1 DCLevels statement
14.2 DCLevels statement example
Annex A DCLevels and DCSets Usage Example (informative)
Describes structures in STIL such that the DC conditions may be specified either globally, by pattern burst, by pattern, or by vector.
DocumentType |
Draft
|
PublisherName |
Institute of Electrical & Electronics Engineers
|
Status |
Withdrawn
|
IEEE 1450 : 2007 | STANDARD TEST INTERFACE LANGUAGE (STIL) FOR DIGITAL TEST VECTOR DATA |
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