IEEE DRAFT 1546 : D3.0 2000

1. OVERVIEW
     1.1 SCOPE
     1.2 PURPOSE
2. REFERENCES
3. DEFINITION OF TERMS AND ACRONYMS
     3.1 KEY TERMS
     3.2 ACRONYMS
4. DTIF FUNCTIONAL GROUPS
     4.1 UUT MODEL GROUP
           4.1.1 PI_NAMES(4)
           4.1.2 PO_NAMES(5)
           4.1.3 MAIN_MODEL(6)
           4.1.4 COMPONENT_TYPE(7)
           4.1.5 USER_NODE(8)
           4.1.6 INPUT_PIN_NAMES(9)
           4.1.7 OUTPUT_PIN_NAMES(10)
           4.1.8 NEAR_FROMS_POINTERS(11)
           4.1.9 NEAR_FROMS(12)
           4.1.10 NODE_SOURCE(16)
           4.1.11 TRISTATE_FROMS_POINTERS(21)
           4.1.12 TRISTATE_FROMS(22)
           4.1.13 PSEUDOPI_NAMES(23)
           4.1.14 AUXILIARY_PIN_NAMES(27)
           4.1.15 NODE_NAMES(35)
     4.2 STIMULUS AND RESPONSE GROUP
           4.2.1 STIMULUS(2)
           4.2.2 PO_RESPONSE(3)
           4.2.3 TIMING_SETS(24)
           4.2.4 TIMING_PER_PATTERN(25)
           4.2.5 PHASE_CONNECTIONS(26)
           4.2.6 PI_FORMATS(28)
           4.2.7 FORMAT_ATTRIBUTES(29)
           4.2.8 BURSTS(33)
           4.2.9 STIMULUS_ TEXT(34)
     4.3 FAULT DICTIONARY GROUP
           4.3.1 F.D._POPATS(18)
           4.3.2 F.D._FAULT_SIGNATURES(19)
           4.3.3 F.D._PRINT_STRINGS(20)
           4.3.4 F.D._CROSS_ REFERENCE(30)
           4.3.5 EQUIV_FAULTS(37)
           4.3.6 F.D._EQUIV_FAULTS(39)
     4.4 PROBE GROUP
           4.4.1 EVENT(13)
           4.4.2 SETTLED_STATE_ONLY(14)
           4.4.3 SETTLED_STATE_&_PULSES(15)
           4.4.4 STEPS(17)
           4.4.5 PROBETAG_DEFINITIONS(31)
           4.4.6 PROBETAG_ASSIGNMENTS(32)
           4.4.7 EVENTS_INIT(36)
           4.4.8 PROBE_DETECTION(38)
5. DTIF APPLICATION EXAMPLE
     5.1 APPLICATION EXAMPLE-UUT MODEL GROUP
     5.2 APPLICATION EXAMPLE-STIMULUS AND RESPONSE
           GROUP
     5.3 APPLICATION EXAMPLE-FAULT DICTIONARY GROUP
     5.4 APPLICATION EXAMPLE-PROBE GROUP

Aids test stimulation vendors when delivering Test Program Set (TPS) products in a format which is compatible with any digital tester. This is achieved by having each simulator vendor format output files in compliance with IEEE Std 1445 and by having each Automatic Test Equipement (ATE) supplier developing a postprocessor that will accept these files. The files may then be converted to run on a specific ATE to test a digital Unit Under Test (UUT). This approach eliminates the problem of having to develop a postprocessor for every simulator type.