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IEEE/IEC 63003-2015
Current
Current
The latest, up-to-date edition.
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IEC/IEEE International standard for the common test interface pin map configuration for high-density, single-tier electronics test requirements utilizing IEEE Std 1505(TM)
Available format(s)
Hardcopy , PDF
Language(s)
English
Published date
30-12-2015
The scope of this standard is the definition of a pin map utilizing the IEEE 1505(TM) 1 receiver fixture interface (RFI).
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