Section 1 - General
1 Scope
2 Conformance
2.1 Optical disk cartridge
2.2 Generating system
2.3 Receiving system
2.4 Compatibility statement
3 Normative references
4 Definitions
4.1 actual write power
4.2 air sandwich disk
4.3 band
4.4 baseline reflectance
4.5 birefringence
4.6 case
4.7 clamping zone
4.8 cover sheet
4.9 cross-talk level
4.10 cyclic redundancy check (CRC)
4.11 defect management
4.12 disk reference plane
4.13 entrance surface
4.14 error correction code (ECC)
4.15 error detection and correction (EDAC)
4.16 format
4.17 hub
4.18 interleaving
4.19 mark
4.20 mark edge
4.21 mark edge recording
4.22 narrow band signal-to-noise ratio
4.23 noise floor
4.24 optical disk
4.25 optical disk carrier
4.26 optical disk cartridge (ODC)
4.27 optical retardation
4.28 perimeter ring
4.29 pre-formatted mark
4.30 protective layer
4.31 read power
4.32 recording layer
4.33 Reed-Solomon code
4.34 spindle
4.35 tilt
4.36 track
4.37 track pitch
4.38 write power
4.39 zone
5 Conventions and notations
5.1 Representation of numbers
5.2 Names
6 List of acronyms
7 General description of the optical disk cartridge
8 General requirements
8.1 Environments
8.2 Temperature shock
8.3 Safety requirements
8.4 Flammability
9 Reference Drive
9.1 Optical system
9.2 Read conditions
9.3 Write conditions
9.4 Tracking
9.5 Rotation of the disk
Section 2 - Mechanical and physical characteristics
10 Dimensional and mechanical characteristics of the case
10.1 General
10.2 Case drawings
10.3 Relationship of sides and interface with carrier
10.4 Materials
10.5 Mass
10.6 Case dimensions
11 Dimensional and mechanical characteristics of the carrier
11.1 General
11.2 Carrier drawings
11.3 Sides, reference axes and reference planes
11.4 Materials
11.5 Mass
11.6 Location of the optical disk centre in the carrier
11.7 Overall dimensions of the carrier
11.8 Cutouts
11.9 Carrier latch points and latch actuation force
11.10 Carrier guide rails and carrier thickness
11.11 Carrier write protect hole
11.12 25 Gbyte capacity sensor hole
11.13 Carrier Side A or Side B sensor hole
11.14 Carrier disk type sensor notches
11.15 Carrier location within the case
11.16 Carrier locator pin slot characteristics and location
within the case
11.17 Carrier latch point location when the carrier is
inside the case
11.18 Carrier latch release hole locations
11.19 Carrier latch release hole locations for unlatched
carrier
11.20 Location of carrier locator pin slots
11.21 Carrier label location
11.22 Carrier label
11.23 Carrier label characteristics
12 Dimensional and physical characteristics of the disk
12.1 General
12.2 Disk drawings
12.3 Sides, reference axes, reference plane
12.4 Dimensions of the disk
12.5 Mass
12.6 Moment of inertia
12.7 Imbalance
12.8 Apparent axial runout
12.9 Residual focus error
13 Handling requirements
13.1 Drop test
13.2 Dead weight strength
14 Interface between disk and drive
14.1 Clamping technique
14.2 Radial positioning
14.3 Reference surface
14.4 Clamping force
15 Characteristics of the protective layer
15.1 Index of refraction
15.2 Thickness
15.3 Optical characteristics
15.4 Tilt
16 Characteristics of the recording layer
16.1 Conformance tests
16.2 Baseline reflectance
16.3 Write power requirement
16.4 Read power requirement
16.5 Prerecorded marks
16.6 Data written in user area
Section 3 - Format of information
17 General description
18 Band organization
18.1 Number of bands on each side of the disk
18.2 Band numbers
18.3 Recordable area in each band
19 Track geometry in each band
19.1 Track shape
19.2 Direction of track spiral and disk rotation
19.3 Track pitch
19.4 Radial eccentricity of pre-formatted information
20 Track format
20.1 Pre-formatted physical track in-track bit spacing
20.2 Pre-formatted physical track layout
20.3 Rotational velocity
20.4 Focus
20.5 Number of sectors in each band
21 Sector format
21.1 Organization of the sectors in each band
21.2 Organization of the usable sectors
21.3 User sector organization
21.4 Lead-in and OD manufacturing test sectors
21.5 Manufacturing control sector
21.6 Disk identification sector(s)
21.7 Primary Defect List sectors
21.8 Supplemental and configuration sectors
21.9 OD write power calibration sectors
21.10 Automatic rewrite sectors
21.11 User sector format for 14,8 Gbytes capacity
21.12 User sector format for 25 Gbyte capacity
21.13 Sectors following the user sectors in each band
22 Coding method
22.1 Coding method for 14,8 Gbyte capacity
22.2 Coding method for 25 Gbyte capacity
23 Defect management
23.1 Defect management description
23.2 Initialization of the disk
23.3 Certification
23.4 Slipping algorithm
23.5 Write procedure
23.6 Primary defect list
23.7 Secondary Defect List (SDL)
23.8 Grown Defect List (GDL)
23.9 Sector Retirement Guidelines
24 Recorded characteristics
25 Error detection and correction (EDAC)
25.1 EDAC field
25.2 EDAC type
26 Data interchange requirements
26.1 Requirements for reading
26.2 Requirements for writing
Annexes
Annex A (normative) Definition of air cleanliness of class 100000
Annex B (normative) Residual tracking error signal test method
Annex C (normative) Mechanical test method
Annex D (normative) Imbalance test method
Annex E (normative) Apparent axial runout test method
Annex F (normative) Residual focus error test method
Annex G (normative) Drop test method
Annex H (normative) Dead weight strength test method
Annex J (normative) Double-pass retardation test method
Annex K (normative) Signal characteristics test method
Annex L (normative) Optical disk write power test method
Annex M (normative) Read power test method
Annex N (normative) Narrow-band signal-to-noise ratio test method
Annex P (normative) Cross-talk test method
Annex Q (normative) Radial runout test method
Annex R (informative) Recommendation for transportation