ISO 13084:2011
Withdrawn
A Withdrawn Standard is one, which is removed from sale, and its unique number can no longer be used. The Standard can be withdrawn and not replaced, or it can be withdrawn and replaced by a Standard with a different number.
View Superseded by
Surface chemical analysis Secondary-ion mass spectrometry Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer
Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users
17-11-2018
English
05-05-2011
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ISO 13084:2011 specifies a method to optimize the mass calibration accuracy in time-of-flight SIMS instruments used for general analytical purposes. It is only applicable to time-of-flight instruments but is not restricted to any particular instrument design. Guidance is provided for some of the instrumental parameters that can be optimized using this procedure and the types of generic peaks suitable to calibrate the mass scale for optimum mass accuracy.
| DevelopmentNote |
DRAFT ISO/DIS 13084 is also available for this standard. (07/2017)
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| DocumentType |
Standard
|
| Pages |
10
|
| PublisherName |
International Organization for Standardization
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| Status |
Withdrawn
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| SupersededBy |
| Standards | Relationship |
| BS ISO 13084:2011 | Identical |
| NEN ISO 13084 : 2011 | Identical |
| 13/30261587 DC : 0 | BS ISO 17862 - SURFACE CHEMICAL ANALYSIS - SECONDARY ION MASS SPECTROMETRY - LINEARITY OF INTENSITY SCALE IN SINGLE ION COUNTING TIME-OF-FLIGHT MASS ANALYSERS |
| ISO/TR 10993-22:2017 | Biological evaluation of medical devices — Part 22: Guidance on nanomaterials |
| ISO 17862:2013 | Surface chemical analysis — Secondary ion mass spectrometry — Linearity of intensity scale in single ion counting time-of-flight mass analysers |
| BS ISO 17862:2013 | Surface chemical analysis. Secondary ion mass spectrometry. Linearity of intensity scale in single ion counting time-of-flight mass analysers |
| PD ISO/TR 10993-22:2017 | Biological evaluation of medical devices Guidance on nanomaterials |
| ISO 23830:2008 | Surface chemical analysis — Secondary-ion mass spectrometry — Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry |
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