ISO 17901-2:2015
Current
Current
The latest, up-to-date edition.
Optics and photonics — Holography — Part 2: Methods for measurement of hologram recording characteristics
Available format(s)
Hardcopy , PDF
Language(s)
English
Published date
29-06-2015
€130.00
Excluding VAT
ISO 17901-2:2015 specifies the terms and measurement method concerning exposure characteristics (exposure characteristic curve, exposure at half-maximum, R-value, amplitude of refractive index modulation) for the hologram recorded by double-beam interference. The materials of hologram to be measured are not restricted to any particular ones. ISO 17901-2:2015 does not intend to restrict manufacturing process.
| Committee |
ISO/TC 172/SC 9
|
| DevelopmentNote |
Supersedes ISO/DIS 17901-2. (07/2015)
|
| DocumentType |
Standard
|
| Pages |
20
|
| PublisherName |
International Organization for Standardization
|
| Status |
Current
|
| Standards | Relationship |
| BS ISO 17901-2:2015 | Identical |
| NEN ISO 17901-2 : 2015 | Identical |
| BS ISO 17901-1:2015 | Optics and photonics. Holography Methods of measuring diffraction efficiency and associated optical characteristics of holograms |
| ISO 17901-1:2015 | Optics and photonics — Holography — Part 1: Methods of measuring diffraction efficiency and associated optical characteristics of holograms |
| ISO 15902:2004 | Optics and photonics — Diffractive optics — Vocabulary |
| ISO 17901-1:2015 | Optics and photonics — Holography — Part 1: Methods of measuring diffraction efficiency and associated optical characteristics of holograms |
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