ISO 24236:2005
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Surface chemical analysis Auger electron spectroscopy Repeatability and constancy of intensity scale
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ISO 20903:2011
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Surface chemical analysis Auger electron spectroscopy and X-ray photoelectron spectroscopy Methods used to determine peak intensities and information required when reporting results
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ASTM E 984 : 2012 : REDLINE
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Standard Guide for Identifying Chemical Effects and Matrix Effects in Auger Electron Spectroscopy
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BS ISO 10810:2010
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Surface chemical analysis. X-ray photoelectron spectroscopy. Guidelines for analysis
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ISO 10810:2010
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Surface chemical analysis X-ray photoelectron spectroscopy Guidelines for analysis
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ISO 13424:2013
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Surface chemical analysis X-ray photoelectron spectroscopy Reporting of results of thin-film analysis
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ASTM E 2735 : 2014 : REDLINE
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Standard Guide for Selection of Calibrations Needed for X-ray Photoelectron Spectroscopy (XPS) Experiments
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05/30124112 DC : DRAFT JULY 2005
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ISO 20903 - SURFACE CHEMICAL ANALYSIS - AUGER ELECTRON SPECTROSCOPY AND X-RAY PHOTOELECTRON SPECTROSCOPY - METHODS USED TO DETERMINE PEAK INTENSITIES AND INFORMATION REQUIRED WHEN REPORTING RESULTS
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BS ISO 13424:2013
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Surface chemical analysis. X-ray photoelectron spectroscopy. Reporting of results of thin-film analysis
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BS ISO 24237:2005
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Surface chemical analysis. X-ray photoelectron spectroscopy. Repeatability and constancy of intensity scale
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04/30109364 DC : DRAFT FEB 2004
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ISO 24236 - SURFACE CHEMICAL ANALYSIS - AUGER ELECTRON SPECTROSCOPY - REPEATABILITY AND CONSTANCY OF INTENSITY SCALE
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ISO/TR 19693:2018
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Surface chemical analysis Characterization of functional glass substrates for biosensing applications
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04/30109361 DC : DRAFT FEB 2004
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ISO 24237 - SURFACE CHEMICAL ANALYSIS - X-RAY PHOTOELECTRON SPECTROSCOPY - REPEATABILITY AND CONSTANCY OF INTENSITY SCALE
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ISO/TR 10993-22:2017
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Biological evaluation of medical devices — Part 22: Guidance on nanomaterials
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09/30191895 DC : 0
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BS ISO 10810 - SURFACE CHEMICAL ANALYSIS - X-RAY PHOTOELECTRON SPECTROSCOPY - GUIDELINES FOR ANALYSIS
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PD ISO/TR 18196:2016
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Nanotechnologies. Measurement technique matrix for the characterization of nano-objects
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ISO/TR 18196:2016
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Nanotechnologies — Measurement technique matrix for the characterization of nano-objects
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16/30333432 DC : DRAFT DEC 2016
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BS ISO 19668 - SURFACE CHEMICAL ANALYSIS - X-RAY PHOTOELECTRON SPECTROSCOPY - ESTIMATING AND REPORTING DETECTION LIMITS FOR ELEMENTS IN HOMOGENEOUS MATERIALS
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BS ISO 19668:2017
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Surface chemical analysis. X-ray photoelectron spectroscopy. Estimating and reporting detection limits for elements in homogeneous materials
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PD ISO/TR 10993-22:2017
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Biological evaluation of medical devices Guidance on nanomaterials
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BS ISO 24236:2005
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Surface chemical analysis. Auger electron spectroscopy. Repeatability and constancy of intensity scale
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ISO 19668:2017
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Surface chemical analysis — X-ray photoelectron spectroscopy — Estimating and reporting detection limits for elements in homogeneous materials
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BS ISO 20903:2011
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Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Methods used to determine peak intensities and information required when reporting results
|
ISO 24237:2005
|
Surface chemical analysis — X-ray photoelectron spectroscopy — Repeatability and constancy of intensity scale
|