ISO 19830:2015
Current
The latest, up-to-date edition.
Surface chemical analysis Electron spectroscopies Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
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English
05-11-2015
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ISO 19830:2015 Standard is to define how peak fitting and the results of peak fitting in X-ray photoelectron spectroscopy shall be reported. It is applicable to the fitting of a single spectrum or to a set of related spectra, as might be acquired, for example, during a depth profile measurement. This International Standard provides a list of those parameters which shall be reported if either reproducible peak fitting is to be achieved or a number of spectra are to be fitted and the fitted spectra compared. This International Standard does not provide instructions for peak fitting nor the procedures which should be adopted.
| DevelopmentNote |
Supersedes ISO/DIS 19830. (11/2015)
|
| DocumentType |
Standard
|
| Pages |
22
|
| PublisherName |
International Organization for Standardization
|
| Status |
Current
|
| Standards | Relationship |
| BS ISO 19830:2015 | Identical |
| ISO 18115-1:2013 | Surface chemical analysis — Vocabulary — Part 1: General terms and terms used in spectroscopy |
| ISO 21270:2004 | Surface chemical analysis X-ray photoelectron and Auger electron spectrometers Linearity of intensity scale |
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